XPS
X-ray Photoelectron Spectroscopy — Staib Instruments
Capabilities and Measurements
- ›Chemical composition and oxidation states of solid material surfaces: inorganic compounds, semiconductors, ceramics, metallic alloys, and biomaterials.
- ›Process quality control.
- ›Contaminant analysis.
- ›Qualitative analysis of the chemical composition of the sample surface.
- ›Characterization of nanomaterials, thin films, and polymers.
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✓Submission Requirements
- Required mass: between 0.5 and 1 gram.
- Dry sample.
- Representative and correctly labeled sample.
!Technical Limitations
- Surface analysis only (analysis depth ~10 nm).
- Detection limit to be added — pending technical confirmation.
- Check schedule availability.