FE-SEM
Field Emission Scanning Electron Microscopy — Hitachi SU5000
Capabilities and Measurements
- ›High-resolution morphological imaging (up to 1.2 nm @ 30 kV, Schottky FE emitter).
- ›Elemental mappings (EDS).
- ›Detection of elements from Na onwards.
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✓Submission Requirements
- Dry sample.
- Representative and correctly labeled sample.
!Technical Limitations
- Cannot detect elements lighter than Na.
- Check schedule availability.